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Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258
Figure 1: a) Schematic view of the optical path allowing good visibility from the top to the tip–sample setup...
Figure 2: Additional two lenses optics which allows for the illumination of the tip–sample interface.
Figure 3: Coarse positioner and scan unit. Panel a shows the entire unit. In panel b the unit is stripped dow...
Figure 4: The atomic force microscope is assembled on a CF200 flange with four tension springs. Copper fins a...
Figure 5: A chromium grain embedded in a polycrystalline copper alloy. a) Measured with a confocal laser micr...
Figure 6: a) Topography, b) dark KPFM and c) 30% laser-power illuminated (470–480 nm and a maximum power of 5...
Figure 7: Panel a shows sections across the SiC p/n-junction (Figure 6) extracted from images taken at various light ...
Figure 8: Simultaneously acquired topography (a) and CPD (b) images of a silicon carbide JBS structure. The s...
Figure 9: a) Close view of the line sections from Figure 8e at the top layer of the structure, together with least-squ...